Attribute model (Distance Overlay): Difference between revisions
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* When configured with multiple [[Attribute timeframes (Distance Overlay)|timeframes]], the value at the index corresponding to the timeframe will be obtained from an Item for the specified [[Key (Distance Overlay)|Key]]. | * When configured with multiple [[Attribute timeframes (Distance Overlay)|timeframes]], the value at the index corresponding to the timeframe will be obtained from an Item for the specified [[Key (Distance Overlay)|Key]]. | ||
|seealso= | |seealso= | ||
* [[ | * [[Key (Distance Overlay)]] | ||
* [[Rasterization (Distance Overlay)]] | * [[Rasterization (Distance Overlay)]] | ||
* [[Grid model (Distance Overlay)]] | * [[Grid model (Distance Overlay)]] | ||
Revision as of 14:15, 11 November 2026
Attribute model is an option in the Distance Overlay wizard. Choosing this option configured a Distance Overlay to select and rasterize an Attribute (Distance Overlay) of one or more Layers.
When selected, the Rasterization property of the Distance Overlay is set to FIRST;
Notes
- When configured with multiple timeframes, the value at the index corresponding to the timeframe will be obtained from an Item for the specified Key.
See also
API Endpoints